AFM
 



AFM - LINTES - AKIYAMA PROBE


1
With the Optical Microscope MM11 we explore the maximum possible surface of the sample (25.000µ x 25.000µ)
and we identify a surface in the volume (5µ x 5µ x 5µ), to be examined with the AFM.
With the Optical Microscope MM11 and the PCa Probe-Carrier we position the probe in the bottom left corner of the surface
(5µ x 5µ) which was identified in the exploration phase, and we approach the probe to a distance of 2µ above this surface.


4
NANOAPPROACH: With the nanopositioning tool we approach the A-probe from 2000nm until the point
where there is interaction between the A-probe and the sample.
5
RAW MAPPING AND CALIBRATION: Tuning of the optical vision with the AFM-mapping
6
FINE MAPPING:

Mapping of the identified XYZ surface




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