|
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Fine Mapping |
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FINE MAPPING
Now that we have a raw mapping of the maximum examinable surface in AFM (5.000nm x 5.000nm) |
| N° | Code | Brand | Description |
31 |
PCa |
Lintes |
|
| 32 | G5100A | Picotest | Function Generator |
| 33 | TDS 220 | Tektronix | Oscilloscope |
| N° | Code | Brand | Description |
| 41 | P-363.3UD | Physik Instrumente | Nanopositioning |
| 42 | Lintes | cavo ethernet nanopositioning -->computer | |
| 43 | Apple | computer microscopio | |
| 44 | LTMatrix | Lintes | SW LTMatrix |

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